Шиков А.К., Черных И.А., Строев А.М., Клевалина Л.В., Пресняков М.Ю., Головкова Е.А., Тихомиров С.А., Занавескин М.Л., Марченков А.Н.
Ключевые слова: HTS, coated conductors, RABITS process, fabrication, buffer layers, texture
Ключевые слова: HTS, coated conductors, critical caracteristics, critical current distribution, review, RABITS process, MOD process, laminations, YBCO, REBCO, substrate Ni-W, hysteresis, MOCVD process, economic analysis, doping effect, Jc/B curves, temperature dependence, composition, angular dependence, thickness dependence, coils solenoidal, hybrid systems, magnetic systems, SMES, transformers, power equipment, cables, dc performance, discharge characteristics, shielding effects, flexible former, current-voltage characteristics, high field tests, ac losses, Roebel conductors, current sharing, presentation
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni-W, texture, reel-to-reel process, magnetron sputtering, buffer layers, fabrication, RABITS process, resistive transition
Ключевые слова: presentation, modeling, numerical analysis, HTS, coated conductors, aspect ratios, RABITS process, ac losses
Ключевые слова: HTS, coated conductors, substrate Ni-W, PLD process, fabrication, RABITS process
Ключевые слова: HTS, YBCO, coated conductors, coils, rotating machines, ac losses, transport currents, modeling, numerical analysis, RABITS process
Ключевые слова: HTS, YBCO, coated conductors, RABITS process, coils pancake, critical caracteristics, ac losses, inductance, experimental results, numerical analysis, comparison
Ключевые слова: HTS, coated conductors, magnetic properties, magnetization, temperature dependence, substrate magnetic, YBCO, RABITS process, IBAD process
Ключевые слова: HTS, YBCO, coated conductor modules, fabrication, substrate Ni-W, buffer layers, microstructure, critical caracteristics, films epitaxial, RABITS process
Ключевые слова: HTS, Bi2223/Ag, tapes, YBCO, coated conductors, power equipment, magnetic properties, critical caracteristics, RABITS process, MOD process, IBAD process, MOCVD process, current-voltage characteristics, critical current, n-value, resistance, temperature dependence, susceptibility, recovery characteristics, FCL resistive, prototype, experimental results
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